Active waveguides by low-fluence carbon implantation in Nd3+-doped fluorophosphate glasses

• DOI: 10.1142/s0217984915502668
• Publication Date: 2016-01-15T12:50:17Z
• Authors: Chun-Xiao Liu; Zhe-Yuan Luo; Yu-Wen Li; Meng Chen; Jun Xu; Li-Li Fu; Ke-Han Yu; Rui-Lin Zheng; Zhi-Guang Zhou; Wei-Nan Li; Hai-Tao Guo; She-Bao Lin; Wei Wei
• Keywords: Waveguide; Beam propagation method; Refractive index profile

A planar waveguide in the Nd[Formula: see text]-doped fluorophosphate glass is fabricated by a 6.0 MeV C[Formula: text] ion implantation at low-fluence of [Formula: ions/cm 2 . The fluence close to that semiconductor industry. dark mode spectra are recorded model 2010 prism coupler. energy losses during process and refractive index profile simulated SRIM code reflectivity calculation method (RCM), respectively. near-field light intensity propagation loss measured an end-face coupling system. two-dimensional (2D) modal transverse electric (TE) for calculated finite difference beam (FD-BPM). results microluminescence optical absorption reveal spectroscopic characteristics nearly unaffected carbon process. This work suggests carbon-implanted promising candidate integrated active devices.