Relaxation of Remanent Polarization in Pb(Zr,Ti)O3Thin Film Capacitors

• DOI: 10.1143/jjap.41.6718
• Publication Date: 2002-12-27T02:48:19Z
• Authors: Kang-Woon Lee; Won-Jong Lee
• Keywords: 0103 physical sciences; 01 natural sciences

The retained charge (memory window) of a ferroelectric capacitor measured by the pulse method is smaller than that continuous wave method. This attributed to relaxation phenomenon which represents fast loss remanent polarization after removal applied voltage. induced depolarization field affected various parameters such as properties and thickness film, measurement temperature, electrode material formation an interfacial layer between film electrodes. In this study, effects each parameter causes were investigated. magnitude increases with initial polarization. increased increasing temperature reduced coercive temperature. fatigue stressing use RuO2 top cause nonswitching electrodes, resulting in large thus loss. reduction also results field.