Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation

• DOI: 10.1145/2966986.2967029
• Publication Date: 2016-10-18T12:23:59Z
• Authors: Handi Yu; Jun Tao; Changhai Liao; Yangfeng Su; Dian Zhou; Xuan Zeng; Xin Li
• Keywords: Rare events

In this paper, a novel Asymptotic Probability Approximation (APA) method is proposed to estimate the overall rare probability of correlated failure events for complex circuits containing large number replicated cells (e.g., SRAM bit-cells). The key idea APA approximate circuit rate based on set carefully defined events. An efficient Hierarchal Subset Simulation (H-SUS) developed calculate aforementioned and statistical methodology further confidence interval APA. Our numerical experiments demonstrate that can accurately reliably estimates involving more than 20,000 independent random variables.