A Prioritized Test Generation Method For Pair-wise Testing

• DOI: 10.11591/telkomnika.v11i1.1880
• Publication Date: 2013-05-22T21:52:30Z
• Authors: Yu Wang; Hao Wu; Zhenyu Sheng
• Keywords: 0202 electrical engineering, electronic engineering, information engineering; 02 engineering and technology

The most sufficient test methods are based on a case set which covers all combinations of parameters. However, the scale cases is always too large and their cost cannot be accepted. People will first consider implementation critical cases. Even if terminated suddenly, high importance have been executed. It improves testing efficiency while securing detection rate defect. contribution this paper how to generate pair-wise with priority. Firstly, We design formulas compute weights priorities. Secondly, we adopt greed algorithm solve combined problems. Furthermore, integrate strategy into genetic makes efficient in parameters sets, ensures its defect under limited resources. DOI: http://dx.doi.org/10.11591/telkomnika.v11i1.1880