Method for rapid inspection of conductive particles based on pseudo-illuminant direction and regional characteristic gradient

• DOI: 10.1360/sst-2020-0296
• Publication Date: 2021-02-03T01:13:42Z
• Authors: Xin ZHANG; Chen LUO; TingXiao FAN; YiJun ZHOU; Lei JIA
• Keywords: Standard illuminant

<p indent=0mm>The traditional image threshold is not effective for detecting conductive particles in a thin-film transistor liquid crystal display (TFT-LCD) circuit due to uneven illumination, micro size, and the large number of involved. To improve accuracy speed TFT-LCD particles, novel method based on gradient proposed. Given variable brightness an image, pseudo-illuminant-direction-detection estimation presented. The directly addresses issue that illuminant model cannot be adapted identify pseudo-illuminant direction. Subsequently, concept regional characteristic introduced. has advantage being less sensitive noise. Furthermore, K-means algorithm modified algorithms are applied compute particles. proposed reached 98.61%; missing rate dropped 1.39%, false was maintained at 1.85%. meet real-time application needs, compute-unified-device-architecture-based parallel computing adopted up implementation. run-time significantly reduced using core running 252.8 times faster, overall ran eight faster than conventional methods. total implementing time two seconds, thus satisfying industry detection requirements.