Cavity ringdown detection of losses in thin films in the telecommunication wavelength window

• DOI: 10.1364/ao.40.001570
• Publication Date: 2007-08-16T16:48:39Z
• Authors: Stephan L. Logunov
• Keywords: 0103 physical sciences; 01 natural sciences

The method of cavity ringdown spectroscopy (when a tunable pulsed optical parametric oscillator was used) extended for the loss evaluation in thin films (2-20-microm thickness). technique applied two key telecommunication wavelength ranges 1260-1330 and 1480-1650 nm. measurement sensitivity determined to be 50 ppm (5 x 10(-5)). results polymer are close correlation with conventional spectrophotometric data propagation planar waveguides. Films greater thickness better quality expected provide an even higher resolution.