Simple method to obtain accurate pretilt angles for thin twisted nematic liquid-crystal cells

• DOI: 10.1364/ao.52.000219
• Publication Date: 2013-01-08T20:38:45Z
• Authors: Sheng-Ya Wang; Kei-Hsiung Yang
• Keywords: Equipment Failure Analysis; Refractometry; Models, Chemical; Transistors, Electronic; Materials Testing; 0103 physical sciences; Computer-Aided Design; Computer Simulation; Equipment Design; 01 natural sciences; Liquid Crystals

Modern thin-film-transistor-driven twisted nematic (TN) products on the market require thin cell gaps below value to satisfy condition of Gooch-Tarry first minimum in transmission for fast response times and wide viewing angles. For time our knowledge, we have developed a simple experimental method based new configuration out-of-plane rotation analyzed data by extended Jones matrix obtain accurate pretilt angles such TN cells where well-accepted Birecki Kahn [The Physics Chemistry Liquid Crystal Devices (1980), p. 115] was insufficient address.