High-resolution multi-scan compact Fourier transform-infrared spectrometer

• DOI: 10.1364/ol.44.003126
• Publication Date: 2019-06-10T13:15:25Z
• Authors: Erga Lifshitz; Uri Arieli; Shahar Katz; Iftach Nir; Assaf Levanon; Michael Mrejen; Haim Suchowski
• Keywords: Fourier transform spectroscopy

The Fourier transform-infrared (FT-IR) spectrometer is a widely used high-resolution spectral characterization method in materials, chemicals, and more. However, the inverse relation between resolution interferometer's arm length yields tradeoff footprint. Here, we introduce novel to overcome this traditional FT-IR limit. enhanced multi-scan compact present achieves an effectively long interferogram by combining multiple short scans. Simulation experimental results demonstrate significant increase of employing our stitching algorithm.