Current Instabilities in Large-Area Silicon Diodes: An Accurate TCAD Approach
Fast-recovery diode, Reverse recovery, Current filaments, Numerical simulations
0202 electrical engineering, electronic engineering, information engineering
02 engineering and technology
DOI:
10.14311/isps.2021.007
Publication Date:
2021-09-24T07:03:01Z
AUTHORS (6)
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