Morphological and optical properties of tin oxide nanomaterial thin film deposited using vacuum evaporation

• DOI: 10.2109/jcersj2.19159
• Publication Date: 2020-02-29T22:08:21Z
• Authors: Muhimmatul KHOIRO; Takeshi HASHISHIN; Melania Suweni MU...; Yono Hadi PRAMONO
• Keywords: Tin oxide; Vacuum evaporation

A 250 nm thick pure tin film was deposited on quartz substrates by vacuum evaporation of 99.9% metal. The films were heated in a two-step annealing sequence for 3 h at 200 and 400 °C with an electric furnace to decrease their surface roughness. This process transformed the into tin(II) oxide. Subsequently, annealed five temperatures each: 600, 700, 800, 900 1000 °C. crystal structure substrate completely SnO2 600 With increase temperature °C, size lattices appeared thin film. In addition, led formation pores surface, but number volume decreased increased temperature. optical properties characterized use visible spectrophotometry which showed high refractive index around 2.08–2.27. Interestingly, highest 2.27, obtained exhibited lowest Urbach energy. Therefore, has potential applications, especially dielectric waveguides solar cells.