A 2.6 mV/b Resolution, 1.2 GHz Throughput, All-Digital Voltage Droop Monitor Using Coupled Ring Oscillators in Intel 4 CMOS

• DOI: 10.23919/vlsitechnologyandcir57934.2023.10185254
• Publication Date: 2023-07-24T17:36:33Z
• Authors: C. Augustine; P. Meinerzhagen; W. Lim; A. Veerabathini; M. Bright; K. Mojjada; J. Tschanz; M. Khellah; V. De
• Keywords: Repeatability

We present an all-digital voltage droop monitor (VDM) with coupled ring-oscillators (CoRO) for accurate in-situ monitoring every clock cycle. Measurements from a 3.2mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> testchip in Intel 4 CMOS containing 9 3-way CoRO and baseline RO VDMs demonstrate 3X improvement resolution $(\sim 2.6$ mV/b) over the baseline. In addition, measurements show $3 \sigma$ uncertainty (repeatability) error of VDM (+/-9mV) is $\sim25$ % lower than The overall detection improvements achieved by are 12mV, 15mV 17mV, respectively, depending on type calibration used - per instance/temperature/die, temperature/die, or die. This corresponds to associated IP power savings 2.9%, 3.2% 3.7% during functional use.