Single Event Transients in CMOS Ring Oscillators

• DOI: 10.3390/electronics8060618
• Publication Date: 2019-06-03T06:08:40Z
• Authors: Jeffrey Prinzie; Valentijn De Smedt
• Keywords: Ring oscillator

In this paper, a time-variant analysis is made on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator used to analyze impact relative moment when particle hits circuit. based simulations and verified experimentally with Two-Photon Absorption (TPA) laser setup. experiments are done using 65 nm test chip.