An Optimized Error Compensation Method for Phase Measurement Profilometry

• DOI: 10.3390/photonics10091036
• Publication Date: 2023-09-11T12:58:08Z
• Authors: Benjun Guo; Yuanping Xu; Chaolong Zhang; Jianfeng Tang; Dan Tang; Chao Kong; Jin Jin
• Keywords: Structured-light 3D scanner

Phase measurement profilometry (PMP) is primarily employed to analyze the morphology of a functional surface with precision. Historically, one most complex and persistent challenges in PMP has been reducing errors stemming from inconsistent indicators at edges surface. In response this challenge, we propose an optimized error compensation methodology specifically designed handle edge artefacts. This introduces Hilbert transform object albedo as tools detect artefact region that need be compensated. Moreover, characteristics sinusoidal fringe waveform propagation direction investigate reconstruction results vertical current directions compensate for The experimental various objects show approach can artefacts by projecting two projection half. compensated root mean square (RMSE) planar reduced over 45%.