The quality assurance test of the SliT ASIC for the J-PARC muon $g-2$/EDM experiment

• DOI: 10.48550/arxiv.2401.11920
• Publication Date: 2024-01-01
• Authors: Takashi Yamanaka; Yoichi Fujita; Eitaro Hamada; T. Kishishita; T. Mibe; Yutaro Sato; Yoshiaki Seino; M. Shoji; Taikain Suehara; M. Tanaka; Junji Tojo; Keisuke Umebayashi; T. Yoshioka
• Keywords: Application-specific integrated circuit

The SliT ASIC is a readout chip for the silicon strip detector to be used at J-PARC muon $g-2$/EDM experiment. production version of SliT128D was designed and mass finished. A quality assurance test method bare chips developed provide sufficient number performed 5735 were inspected. No defect observed in 84.3%. Accepting few channels with poor time walk performance out 128 per chip, more than 90% yield can achieved, which construct whole detector.