Quantum-Enhanced Multi-Parameter Sensing in a Single Mode

• DOI: 10.48550/arxiv.2412.04865
• Publication Date: 2024-01-01
• Authors: Valahu, Christoph...; Stafford, Matthew P.; Huang, Zixin; Matsos, Vassili G.; Millican, Maveric...; Chalermpusitarak,...; Menicucci, Nicola...; Combes, Joshua; Baragiola, Ben Q.; Tan, Ting Rei
• Keywords: Quantum Physics; FOS: Physical sciences; Quantum Physics (quant-ph)

Main text: 8 pages, 4 figures; Supplemental material: 37 pages, 16 figures<br/>Precision metrology underpins scientific and technological advancements. Quantum metrology offers a pathway to surpass classical sensing limits by leveraging quantum states and measurement strategies. However, measuring multiple incompatible observables suffers from quantum backaction, where measurement of one observable pollutes a subsequent measurement of the other. This is a manifestation of Heisenberg's uncertainty principle for two non-commuting observables, such as position and momentum. Here, we demonstrate measurements of small changes in position and momentum where the uncertainties are simultaneously reduced below the standard quantum limit (SQL). We measure $\textit{modular observables}$ using tailored, highly non-classical states that ideally evade measurement backactions. The states are deterministically prepared in the single mode of the mechanical motion of a trapped ion using an optimal quantum control protocol. Our experiment uses grid states to measure small changes in position and momentum and shows a metrological gain of up to 5.1(5)~dB over the simultaneous SQL. Using an adaptive-phase estimation algorithm with Bayesian inference, we estimate these displacements with a combined variance of 2.6(1.1)~dB below the SQL. Furthermore, we examine simultaneously estimating $\textit{number}$ and $\textit{phase}$, which are the polar counterparts of position and momentum. This is performed by preparing a novel quantum resource -- number-phase states -- and we demonstrate a metrological gain over their SQL. The combination of quantum control and multi-parameter quantum metrology marks a significant step towards unprecedented precision with applications ranging from fundamental physics to advanced quantum technologies.<br/>