Electron Fourier ptychography for phase reconstruction

• DOI: 10.48550/arxiv.2502.08342
• Publication Date: 2025-02-12
• Authors: Jingjing Zhao; Chen Huang; Ali Mostaed; Amirafshar Moshta...; James M. Parkhurst; Iván Lobato; Marcus Gallagher-...; Judy S. Kim; Mark Boyce; David I. Stuart; Elena A. Andreeva; Jacques‐Philippe ...; Angus I. Kirkland
• Keywords: Ptychography; Phase problem

Phase reconstruction is important in transmission electron microscopy for structural studies. We describe Fourier ptychography and its application to phase of both radiation-resistant beam-sensitive materials. demonstrate that the exit wave can be reconstructed at high resolution using a modified iterative retrieval algorithm with data collected an alternative optical geometry. This method achieves spatial 0.63 nm fluence $4.5 \times 10^2 \, e^-/\text{nm}^2$, as validated on Cry11Aa protein crystals under cryogenic conditions. Notably, this requires no additional hardware modifications, straightforward implement, seamlessly integrated existing collection software, providing broadly accessible approach