Measurement of Multi-Port S-Parameters using Four-Port Network Analyzer

• DOI: 10.5573/jsts.2013.13.6.589
• Publication Date: 2014-01-20T20:34:01Z
• Authors: Jongmin Kim; Duc Long Luong; Wansoo Nah; SoYoung Kim
• Keywords: Port (circuit theory); Network analyzer (electrical)

An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using four-port vector network analyzer (VNA) without external un-terminated ports. By VNA, reflected waves from ports could be minimized. The method significantly enhances accuracy S-parameters with less number measurements compared results classical renormalization technique which uses twoport VNA. validated measured data coupled 8-port micro-strip lines.