Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method

• DOI: 10.5573/jsts.2014.14.2.202
• Publication Date: 2014-07-17T08:30:28Z
• Authors: NaHyun Kim; Wansoo Nah; SoYoung Kim
• Keywords: Decoupling (probability)

The bulk current injection (BCI) and direct power (DPI) method have been established as the standards for electromagnetic susceptibility (EMS) test. Because BCI test uses a probe to inject magnetically coupled (EM) noise, there is significant difference between supplied by radio frequency (RF) generator that transferred integrated circuit (IC). Thus, immunity estimated forward cannot show of IC itself. This paper derives real injected at failure point using transfer efficiency method. We propose mathematically derive based on equivalent models representing setup. performed I/O buffers with without decoupling capacitors, their immunities are evaluated traditional proposed in this work. shows actual noise level can tolerate. Using an indicator EMS test, we on-chip capacitor enhances EM immunity.