The Development of a Superconducting RF Electron Microscope

• DOI: 10.7566/jpscp.1.014023
• Publication Date: 2014-04-11T05:41:27Z
• Authors: Nao Higashi; Takaaki Furuya; Yoshisato Funahashi; Kenji Ueno; Motoaki Sawabe; Michiru Nishiwaki; Hiroshi Sakai; Shinichiro Michizono; Masahiro Yamamoto; Atsushi Enomoto; Yukihide Kamiya; Masao Kuriki; Satoru Yamashita
• Keywords: 02 engineering and technology; 0210 nano-technology

We are developing a new type of electron microscope (EM), which utilizes the RF acceleration to exceed energy limit DC used in conventional EMs.This enables us make more compact high-voltage EMs, examine thicker specimens, and possibly obtain better spatial temporal resolutions.However, will increase dispersion, ∆E/E, because its sinusoidal field.Thus, we have designed specially shaped cavity second harmonic field, TM 020 , is superposed on first accelerating 010 .To demonstrate our proof-of-principle concept, prototype based 300 keV transmission by employing photocathode gun two-mode for acceleration.The already fabricated nearly satisfies basic design parameters.We now fabricating beam test later this year.