A5045018235- Advanced Electron Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Advanced X-ray Imaging Techniques
- Force Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Ion-surface interactions and analysis
- Electronic and Structural Properties of Oxides
- Advancements in Photolithography Techniques
- Surface and Thin Film Phenomena
- Thermal properties of materials
- Advanced Fluorescence Microscopy Techniques
- Semiconductor materials and devices
- Particle Accelerators and Free-Electron Lasers
- Ga2O3 and related materials
- Machine Learning in Materials Science
- Computational Physics and Python Applications
- Nuclear Physics and Applications
- Silicon and Solar Cell Technologies
- Quantum Dots Synthesis And Properties
- Magnetic properties of thin films
- Genetics, Bioinformatics, and Biomedical Research
- Spectroscopy and Quantum Chemical Studies
- X-ray Spectroscopy and Fluorescence Analysis
- Physics of Superconductivity and Magnetism
Nion (United States)
2015-2024
Bruker (United States)
2024
Columbia University
2010
Google (United States)
2009
Cornell University
2008
Chungnam National University
2008
The University of Tokyo
2008
Oak Ridge National Laboratory
2004
University of Cambridge
1997
Despite the use of electrons with wavelengths just a few picometers, spatial resolution in transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns crystalline lattice can therefore only be imaged for low-order orientations, limiting range defects that at resolution. The recent development correctors microscopy allows this limit overcome. We present direct images from an aberration-corrected scanning TEM...
The identification of isotopic labels by conventional macroscopic techniques lacks spatial resolution and requires relatively large quantities material for measurements. We recorded the vibrational spectra an α amino acid, l-alanine, with damage-free "aloof" electron energy-loss spectroscopy in a scanning transmission microscope to directly resolve carbon-site-specific real space nanoscale resolution. An red shift 4.8 ± 0.4 milli-electron volts C-O asymmetric stretching modes was observed...
The ability to localize, identify, and measure the electronic environment of individual atoms will provide fundamental insights into many issues in materials science, physics, nanotechnology. We demonstrate, using an aberration-corrected scanning transmission electron microscope, spectroscopic imaging single La inside CaTiO3. Dynamical simulations confirm that information is spatially confined around scattering atom. Furthermore, we show how depth atom within crystal may be estimated.
A new corrector of spherical aberration (C(S)) for a dedicated scanning transmission electron microscope (STEM) is described and its results are presented. The uses strong octupoles increases C(C) by only 0.2 mm relative to the uncorrected microscope. Its overall stability greatly improved compared our previous design. It has achieved point-to-point resolution 1.23 in high-angle annular dark field images at 100 kV. also increased current available 1.3 A-sized probe about factor ten existing...
An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution electron energy-loss spectroscopy in the scanning transmission microscope is described. It will link energy being selected by monochromator to analysed spectrometer, without resorting decelerating beam. This allow it attain spectral stability comparable systems using monochromators and spectrometers that are raised near high voltage of instrument. also be able correct chromatic aberration probe-forming column....
Abstract Vibrational spectroscopy in the electron microscope would be transformative study of biological samples, provided that radiation damage could prevented. However, beams typically create high-energy excitations severely accelerate sample degradation. Here this major difficulty is overcome using an ‘aloof’ beam, positioned tens nanometres away from sample: are suppressed, while vibrational modes energies <1 eV can ‘safely’ investigated. To demonstrate potential aloof spectroscopy,...
Vibrational modes affect fundamental physical properties such as the conduction of sound and heat can be sensitive to nano- atomic-scale structure. Probing momentum transfer dependence vibrational provides a wealth information about materials system; however, experimental work has been limited essentially bulk averaged surface approaches or small wave vectors. We demonstrate combined theoretical methodology for nanoscale mapping optical acoustic phonons across first Brillouin zone, in...
Heat dissipation in integrated nanoscale devices is a major issue that requires the development of temperature probes. Here, we report implementation method combines electron energy gain and loss spectroscopy to provide direct measurement local nanoenvironment. Loss peaks corresponding an optical-phonon mode boron nitride were measured from room $\ensuremath{\sim}1600\text{ }\text{ }\mathrm{K}$. Both exhibit shift towards lower energies as sample heated up. First-principles calculations...
The origins and the recent accomplishments of aberration correction in scanning transmission electron microscopy (STEM) are reviewed. It is remembered that successful imaging aberrations round lenses owes much to spectrum achieved energy loss spectrometers 2-3 decades earlier. Two noteworthy examples types STEM investigation has made possible shown: single-atom impurities graphene analyzing atomic bonding single atoms by spectroscopy (EELS). Looking towards future, a new all-magnetic...
We characterize a hybrid pixel direct detector and demonstrate its suitability for electron energy loss spectroscopy (EELS). The has large dynamic range, narrow point spread function, detective quantum efficiency ≥ 0.8 even without single arrival discrimination, it is resilient to radiation damage. It capable of detecting ~5 × 106 electrons/pixel/second, allowing accommodate up pA per hence >100 EELS zero-loss peak (ZLP) saturation, if the ZLP over >125 pixels (in non-dispersion direction)....
We have designed and built an imaging filter which can be attached to most stan- dard TEMs, is capable of operating at primary energies up 400 keV.The uses a 90°m agnetic sector prism, piezoelectrically controlled energy-selecting slit, 6 quadrupole 5 sextupole lenses.It fully corrects second-order aberrations distortions in images formed with electrons selected energies, it also produces aberration-corrected spectra vari- able dispersion.We show the first applications 200 keV energy,...
Recent developments in instrumentation for electron energy loss spectroscopy (EELS) at Gatan R&D are reviewed.A 10-channel intrinsic Si detector with single-electron detection capa- bility is being developed fast energy-filtered imaging and elemental mapping the STEM mode.A new type of an filter suitable attachment end electron-optical column a transmission microscope has been designed built.The design described, its properties compared optimized 03A9-filter.Finally, unconventional...
Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon platinum in monolayer multilayer graphene are identified. Simultaneously acquired loss spectra confirm the elemental identification. Contamination difficulties overcome by employing near-UHV sample conditions. Signal intensities agree within a factor two with standardless estimates.
Abstract The ability to examine the vibrational spectra of liquids with nanometer spatial resolution will greatly expand potential study and liquid interfaces. In fact, fundamental properties water, including complexities in its phase diagram, electrochemistry, bonding due nanoscale confinement are current research topics. For any liquid, direct investigation ordered structures, interfacial double layers, adsorbed species at liquid–solid interfaces interest. Here, a novel way characterizing...
A Nion spherical-aberration (Cs) corrector was recently installed on Lehigh University's 300-keV cold field-emission gun (FEG) Vacuum Generators HB 603 dedicated scanning transmission electron microscope (STEM), optimized for X-ray analysis of thin specimens. In this article, the impact Cs-corrector is theoretically evaluated, in terms expected improvements spatial resolution and analytical sensitivity, calculations are compared with initial experimental results. Finally, possibilities...