A5073566939- Ion-surface interactions and analysis
- Nuclear Physics and Applications
- Electron and X-Ray Spectroscopy Techniques
- Silicon and Solar Cell Technologies
- X-ray Spectroscopy and Fluorescence Analysis
- Semiconductor materials and devices
- Thin-Film Transistor Technologies
- Radiation Effects in Electronics
- Topological Materials and Phenomena
- Atomic and Molecular Physics
- Semiconductor Quantum Structures and Devices
- Advanced Semiconductor Detectors and Materials
- Radiation Therapy and Dosimetry
- Radiation Detection and Scintillator Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Quantum and electron transport phenomena
- Graphene research and applications
- Silicon Nanostructures and Photoluminescence
- Semiconductor materials and interfaces
- Particle Detector Development and Performance
- Mass Spectrometry Techniques and Applications
- Plasmonic and Surface Plasmon Research
- Advanced Chemical Physics Studies
- Nanowire Synthesis and Applications
- Random lasers and scattering media
University of Regensburg
2016-2025
Institute of Photonic Sciences
2019-2024
Robert Bosch (Germany)
2024
IRIS Technology Solutions (Spain)
2022
Cornell University
2022
University of Stuttgart
1975-2022
United States Naval Academy
2002-2020
Johannes Kepler University of Linz
2015-2018
Martin Luther University Halle-Wittenberg
2012-2016
Luther University
2013
This paper reviews the basic physics of those cosmic rays which can affect terrestrial electronics. Cosmic at sea level consist mostly neutrons, protons, pions, muons, electrons, and photons. The particles cause significant soft fails in electronics are with strong interaction: pions. At level, about 95% these neutrons. quantitative flux neutrons be estimated to within 3×, relative variation neutron latitude, altitude, diurnal time, earth's sidereal position, solar cycle is known even higher...
This historical review covers IBM experiments in evaluating radiation-induced soft fails LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
The formalism for calculating the stopping of energetic light ions (H, He, and Li) at energies above 1 MeV/u, has advanced to point that powers may now be calculated with an accuracy a few percent all elemental materials. Although subject been interest century, only recently have final required corrections understood evaluated. theory ion is reviewed emphasis on those aspects pertain calculation accurate powers.
A method is developed for evaluating the effects of cosmic rays on computer memories and applied to some typical memory devices. The sea-level flux cosmic-ray particles reviewed interaction each type particle with silicon estimated, emphasis processes that produce bursts charge. These charge pulses are then related large-scale integrated circuit components cosmic-ray-induced errors estimated. shielding (such as building ceilings walls), altitude, solar cycle Cosmic-ray nucleons muons can...
A method for the measurement of concentration hydrogen versus depth in solids using 1H+15N resonant nuclear reaction is discussed. This has a typical resolution 50–100 Å, can be used to several microns, and measure concentrations one part per thousand or greater.
We report measurements of the hydrogen concentrations and densities amorphous silicon films prepared from glow discharge plasmas silane. Quantitative results are obtained resonant nuclear reaction 15N+1H→12C+4He+γ by counting emitted γ rays. Mass spectrographic analysis gases evolved upon heating also used to estimate relative for different preparation conditions. Comparisons given previously reported infrared absorption electron microprobe estimates.
This article presents an overview of the fabrication methods black silicon, their resulting morphologies, and a quantitative comparison optoelectronic properties. To perform this comparison, different groups working on silicon solar cells have cooperated for study. The optical absorption minority carrier lifetime are used as benchmark parameters. differences in processes plasma etching, chemical or laser processing discussed compared with numerical models. Guidelines to optimize relevant...
Cosmic rays may cause soft fails in electronic logic or memory. The IBM Journal of Research and Development, Volume 40, No. 1, discussed this complex event detail. In order to predict fail rates from cosmic particles, it is necessary know the local ray flux. This paper reviews penetration through earth's atmosphere, parameters which affect terrestrial final particle flux shown vary mainly with site's geomagnetic coordinates its altitude. describes detail quantitative at one datum (New York...
High-resolution measurements of the differential cross sections for inelastic scattering 28- to 73-MeV electrons by ${\mathrm{Pb}}^{206}$, ${\mathrm{Pb}}^{207}$, ${\mathrm{Pb}}^{208}$, and ${\mathrm{Bi}}^{209}$ nuclei have been analyzed using a distorted-wave code extract reduced nuclear radiative transition probabilities [$B(\mathrm{EL})$'s], radii. The use an irrotational incompressible vibrating-liquid-drop model resulted in good fits data. In agreement with de-Shalit's weak-coupling...
A material has been developed which allows a new approach to be made the conversion of solar energy heat. It consists dense array metal whiskers grown with spacings few wavelengths visible light. The selected low emissivity, and achieves significant optical absorption by trapping light geometric maze effect. We have deomonstrated that normal incidence is greater than 98% from 0.5 40-μm wavelengths, hemispherical emissivity at 550 °C can less 0.26. Since surfaces single refractory element,...
A new technique is described in detail which can be used to profile boron impurities almost any substrate a depth of few microns. It uses the reaction 10B (n,4He)7Li convert atoms monoenergetic α particles are detected after they leave target. The sensitive at levels as low 3 ppm, with resolution ±20/nm for silicon. deconvoluting this type experimental data detail. Methods presented eliminate problem spurious oscillations deconvoluted data. Examples shown analyze various distributions
This paper presents a review of experiments performed by IBM to investigate the causes soft errors in semiconductor memory chips under field test conditions. The effects alpha-particles and cosmic rays are separated comparing multiple measurements soft-error rate (SER) samples deep underground at various altitudes above earth. results case studies on four different show that an important source ionizing radiation errors. testing used confirm accuracy modeling accelerated chips.