A5048290082- Non-Destructive Testing Techniques
- EEG and Brain-Computer Interfaces
- Electron and X-Ray Spectroscopy Techniques
- Neuroscience and Neural Engineering
- Electrical and Bioimpedance Tomography
- Advancements in Photolithography Techniques
- ECG Monitoring and Analysis
- Surface Roughness and Optical Measurements
- Blind Source Separation Techniques
- Flow Measurement and Analysis
- Neural dynamics and brain function
- Minerals Flotation and Separation Techniques
- Wireless Sensor Networks for Data Analysis
- Advanced X-ray and CT Imaging
- Scientific Measurement and Uncertainty Evaluation
- Advanced Chemical Sensor Technologies
- Advanced Sensor Technologies Research
- Sensor Technology and Measurement Systems
- Embedded Systems Design Techniques
- Welding Techniques and Residual Stresses
- Spectroscopy and Chemometric Analyses
- Geophysical and Geoelectrical Methods
- Neurological disorders and treatments
- Magnetic Field Sensors Techniques
Warsaw University of Technology
2007-2017
Electrotechnical Institute
2014
The article presents the use of genetic algorithm (GA) to select and classify ERD/ERS patterns. One hundred twenty eight channel EEG signal was used in experiments. recorded for 40 people, during process imagining right left hand movements. Feature extraction performed using frequency analysis (FFT) with resolution 1Hz. So features were spectral lines associated particular electrodes. selection features, calculated all made GA. fitness function GA classification error LDA classifier 5-CV...
This study was carried out to select EEG signal preprocessing methods effectively detect and classify Steady State Visually Evoked Potentials (SSVEP). Algorithms, such as: Common Average Reference, Independent Component Analysis (in the task of electrooculography artifacts removing SSVEP enhancement) combinations them were implemented tested. The best classification accuracy improvement obtained for CAR ICA-SSVEP methods. Experiments showed high usefulness these in context detection.
The magnetic field that is generated by different electric devices in an environment of a scanning electron microscope (SEM) causes the direction beam to become distorted and, consequently, registered images distorted. This paper describes method for measurement affecting beam. It consists analysis SEM are several distances between final aperture column and specimen. Means constant periodic explained. presented examples show results coils placed either inside or outside chassis. compared...
Different types of distortions in scanning electron microscopy require different methods their elimination, and therefore influence these on particular elements the SEM system should be known. The proposed method allows for separation direct magnetic field beam chamber from its column generated block. For this purpose, a series distorted images is registered several working distances (between final aperture specimen) energies electrons. Magnitudes are measured images. each applied energy,...
Image deformations caused by electromagnetic interference (EMI) are ones of the most frequent undesirable effects in practical scanning electron microscopy. They usually appear, even although place chosen for a microscope system fulfills EMI conditions, as periodic deformation vertical edges an observed specimen. Available, but still very expensive methods decreasing their influence shielding and field compensation. The other approach is digital image processing its correction. However,...