J. X. Sierra

ORCID: 0000-0003-0737-4665
Publications
Citations
Views
---
Saved
---
About
Contact & Profiles
Research Areas
  • Advancements in Solid Oxide Fuel Cells
  • Catalysis and Oxidation Reactions
  • Advanced X-ray Imaging Techniques
  • Advanced Electron Microscopy Techniques and Applications
  • Machine Learning in Materials Science
  • Nuclear Physics and Applications
  • X-ray Diffraction in Crystallography
  • Ferroelectric and Piezoelectric Materials
  • Electronic and Structural Properties of Oxides
  • Catalytic Processes in Materials Science
  • Electron and X-Ray Spectroscopy Techniques

Technical University of Denmark
2018-2019

Abstract We present an instrument for dark-field x-ray microscopy installed on beamline ID06 of the ESRF — first its kind. Dark-field uses full field illumination sample and provides three-dimensional (3D) mapping micro-structure lattice strain in crystalline matter. It is analogous to electron that objective lens magnifies diffracting features sample. The use high-energy synchrotron x-rays, however, means these can be large deeply embedded. 3D movies acquired with a time resolution seconds...

10.1088/1757-899x/580/1/012007 article EN IOP Conference Series Materials Science and Engineering 2019-08-01
Coming Soon ...