A5100394272- Optical Polarization and Ellipsometry
- Spectroscopy and Chemometric Analyses
- Advancements in Semiconductor Devices and Circuit Design
- Radio Frequency Integrated Circuit Design
- Analog and Mixed-Signal Circuit Design
- Plasmonic and Surface Plasmon Research
- Photonic and Optical Devices
- Tuberculosis Research and Epidemiology
- Infectious Diseases and Tuberculosis
- Photonic Crystals and Applications
- Advanced X-ray Imaging Techniques
- Calibration and Measurement Techniques
- Orthopedic Infections and Treatments
- Vibration and Dynamic Analysis
- Advanced Materials Characterization Techniques
- Optical Coatings and Gratings
- Spectroscopy Techniques in Biomedical and Chemical Research
- Leaf Properties and Growth Measurement
- Energetic Materials and Combustion
- Aerodynamics and Acoustics in Jet Flows
- Wood and Agarwood Research
- Intermetallics and Advanced Alloy Properties
- Theoretical and Computational Physics
- Nanocluster Synthesis and Applications
- Acoustic Wave Phenomena Research
Sichuan University
2024
Yangzhou University
2022
Palace Museum
2022
Fudan University
2020-2021
Xiamen University
2018-2019
Advanced Digital Sciences Center
2018
Jiangxi Science and Technology Normal University
2016
To investigate chemical and color changes of the polymeric constituents black locust (Robinia pseudoacacia) wood during heat treatment, extractive-free flour was conditioned to 30% initial moisture content (MC) heated for 24 h at 120 °C in either an oxygen or nitrogen atmosphere. The change measured using CIELAB system. Chemical components were determined by means solid state cross-polarization/magic angle spinning 13C-nuclear magnetic resonance (CPMAS-13C-NMR), Fourier transform infrared...
Silver (Ag) films with different nanostructures were prepared by electron beam evaporation and characterized spectroscopic ellipsometry in combination X-ray diffraction field emission scanning microscopy (FESEM). The percolation threshold the of Ag can be deduced from measured ellipsometric parameters (Ψ, Δ). According to topological properties Δ) trajectories, was determined lie between coverage 66 79.6%. result further confirmed plus–minus sign real part dielectric function infrared....
In this paper, we propose a bandpass filter based on hybrid spoof surface plasmon polaritons (SSPPs) and substrate integrated waveguide (SIW). This consists of meandered slots arrays etched the top metal layers an SIW to support polariton (SSPP) modes. We simulated dispersion characteristic unit cell, find that can engineer filter's characteristics at will by tuning parameters cell. By introducing tapered transitions, back-to-back microstrip structure is designed realize impedance matching...
The crack growth of transparent materials after laser wavelength irradiation was studied. It is known that used in many applications for the ablation undesired material and/or coatings. impact on cracks studied using digital holography (DH) technique. Transparent samples were irradiated near-ultraviolet, visible, near-infrared, and infrared light. DH system able to detect by a range wavelengths. Results also show light with near-infrared wavelengths has great effect growth. High-resolution...
We propose an accurate and rapid azimuth calibration method for polarizing elements in ellipsometry. Over 200 calibrations were achieved simultaneously at different wavelength points a spectral range of 550–650 nm without any calibrated element. The the polarizer was determined from differential analysis on ellipse reflected light. information is experimentally acquired by rotating element spectrometer. presented performed verified with Si Au bulk, respectively, showing reliability...
We proposed a method to study the effects of azimuth and incident angle on accuracy stability rotating polarizer analyzer ellipsometer (RPAE) with bulk Au. The dielectric function was obtained at various angles in range 55°–80° analyzed spectrum principal angle. initial orientations polarizing elements were deviated by series act as azimuthal errors modes. spectroscopic measurements performed wavelength 300–800 nm an interval 10 nm. repeatedly-measured ellipsometric parameters determined...
We constructed and investigated a high-speed broadband spectroscopic ellipsometric system with 12 polarization channels two-dimensional charge-coupled device. The without any mechanically-moving component completes the measurements of more than 10000 signals at 889 data points in wavelength range 400-800 nm within 150 ms, spectral resolution better 1 nm. An integrated analyzer consisting sub-analyzers was employed to obtain light different states simultaneously. distribution acquired by...
A pico-watt voltage reference (VR) for IoT systems is proposed in this paper. By employing a pre-regulation technique, the VR achieves an ultra-high performance of line regulation (LR) and PSRR. Based on standard 0.18-μm CMOS process, temperature-independent characteristics design are obtained by taking advantage threshold (V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">TH</sub> ) differences 5 V 1.8 PMOS transistors. Simulation results show...
An ultra-low power subthreshold voltage reference (VR) with a high performance of line regulation (LR) and supply rejection ratio (PSRR) based on leakage current characteristics MOSFETs is designed using only one type MOSFETs. Evaluation results show that the proposed VR achieves an ultra-high 250 ppm/V PSRR level -74 dB at 100 Hz while ranges from 1.6 V to 2.8 V. The minimum temperature coefficient (TC) 58.5 ppm/°C 0 °C 120 °C. consumption 73 pA room (27 °C).
An anchor-shaped plasmonic waveguide based on spoof surface plasmon polaritons (SSPPs) is proposed and analyzed in this paper. The dispersion characteristic of the unit cell simulated, much lower asymptotic frequency can be obtained compared with normal corrugated cell. transmission characteristics manipulated by adusting depth grooves. By introducing taped transitions, a back-to-back coplanar - structure designed to verify properties waveguide.
The melting and deflagration of nanometer indium particle thin films with an average diameter 43.2 nm were characterized by temperature-dependent ellipsometry. During ellipsometric measurement, the sample temperature varied from room to 270 °C. Two sharp breakpoints in curves parameters found at 155 251 °C, respectively. former breakpoint °C is ascribed a physical phase change solid liquid, later one due chemical liquid oxide. just point particles, which was observed measurement for first...