Kartik Venkataraman

ORCID: 0000-0003-1118-6376
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About
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Research Areas
  • Physics of Superconductivity and Magnetism
  • ZnO doping and properties
  • Magnetic and transport properties of perovskites and related materials
  • Climate variability and models
  • Superconducting Materials and Applications
  • Advancements in Photolithography Techniques
  • Advanced Vision and Imaging
  • Hydrology and Drought Analysis
  • Image Processing Techniques and Applications
  • Advanced Surface Polishing Techniques
  • Electronic and Structural Properties of Oxides
  • Computer Graphics and Visualization Techniques
  • Superconductivity in MgB2 and Alloys
  • Optical measurement and interference techniques
  • Arsenic contamination and mitigation
  • Hydrology and Watershed Management Studies
  • Optical Coatings and Gratings
  • Catalytic Processes in Materials Science
  • Catalysis and Oxidation Reactions
  • CCD and CMOS Imaging Sensors
  • Glass properties and applications
  • Groundwater and Isotope Geochemistry
  • Environmental Justice and Health Disparities
  • Advanced Materials and Mechanics
  • Material Science and Thermodynamics

Tarleton State University
2013-2023

KLA (United States)
2015-2017

Pelican Cancer Foundation
2013-2014

Texas A&M University – Kingsville
2011-2012

Lam Research (United States)
2008-2011

University of Wisconsin–Madison
1963-2009

University of California, Santa Cruz
2005-2008

Argonne National Laboratory
2002-2006

Micron (United States)
2005-2006

University of Wisconsin System
2005

We present PiCam (Pelican Imaging Camera-Array), an ultra-thin high performance monolithic camera array, that captures light fields and synthesizes resolution images along with a range image (scene depth) through integrated parallax detection superresolution. The is passive, supporting both stills video, low capable, small enough to be included in the next generation of mobile devices including smartphones. Prior works [Rander et al. 1997; Yang 2002; Zhang Chen 2004; Tanida 2001; 2003;...

10.1145/2508363.2508390 article EN ACM Transactions on Graphics 2013-11-01

Segmentation of transparent objects is a hard, open problem in computer vision. Transparent lack texture their own, adopting instead the scene background. This paper reframes object segmentation into realm light polarization, i.e., rotation waves. We use polarization camera to capture multi-modal imagery and couple this with unique deep learning backbone for processing input data. Our method achieves instance on cluttered, various background conditions, demonstrating an improvement over...

10.1109/cvpr42600.2020.00863 article EN 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) 2020-06-01

10.1016/j.jhydrol.2018.10.054 article EN publisher-specific-oa Journal of Hydrology 2018-10-27

A digital camera is a complex system including lens, sensor (physics and circuits), image processor, where each component sophisticated on its own. Since prototyping very expensive, it highly desirable to have the capability explore design tradeoffs preview output ahead of time. An empirical imaging simulation that aims achieve such goal presented. It traces photons reflected by objects in scene through optics color filter array, converts into electrons with consideration noise introduced...

10.1109/ted.2009.2030995 article EN IEEE Transactions on Electron Devices 2009-10-08

Abstract Catalytic wall reactors permit high heat‐transfer rates between exothermic and endothermic reactions taking place catalytically on opposite sides of a thin wall, because they eliminate resistance to heat transfer in thermal boundary layers, thus making them compact efficient. A parallel plate catalytic reactor was built which methane combustion platinum steam reforming rhodium occurred walls alternate channels. This gave 95% conversion synthesis gas with residence time ∼70 ms at...

10.1002/aic.690490518 article EN AIChE Journal 2003-05-01

Thin film embodiments of MBa 2 Cu 3 O 7- x (MBCO, M = yttrium or a rare-earth metal) prepared by several different deposition methods on variety substrates were investigated Raman microspectroscopy. Several the unique characterization capabilities spectroscopy in analysis MBCO thin films are highlighted results these investigations. The active phonons orthorhombic and tetragonal forms that most useful for textured diagrammed discussed. A rapid procedure qualitative texture mapping using...

10.1366/0003702053945958 article EN Applied Spectroscopy 2005-05-01

We report on the structural and transport properties of EuBa2Cu3O7−x (Eu123) films SrTiO3 substrates. A substrate temperature 100 °C higher than that used to deposit YBa2Cu3O7−x (Y123) is needed grow high-performance Eu123 directly However, this high-temperature restriction can be circumvented by inserting a seed layer (∼12 nm) Y123, Gd123, or Dy123 between Eu123. analysis reveals transition region promotes growth a-axis first formed surface if deposited at less 800 °C. On other hand, use...

10.1063/1.1601680 article EN Applied Physics Letters 2003-08-14

Reel-to-reel x-ray diffraction (XRD) and Raman micro-spectroscopy are being evaluated as potential diagnostic tools for on-line feedback in the manufacturing of long-length coated conductors. To facilitate this evaluation, a procedure based on differentially heat-treated Y–BaF2–Cu precursors exposed to time-synchronized phase composition gradients has been developed. Two time-gradient-processed Y Ba2Cu3O7−x (YBCO) tapes different thicknesses were fabricated using procedure. The two...

10.1088/0953-2048/17/6/002 article EN Superconductor Science and Technology 2004-03-30

CD uniformity requirements at 20nm and more advanced nodes have challenged the precision limits of CD-SEM metrology, conventionally used for scanner qualification in-line focus/dose monitoring on product wafers. Optical metrology has consequently gained adoption these applications because its superior precision, but been limited adopted, due to challenges with long time-to-results robustness process variation. Both are limitations imposed by geometric modeling photoresist (PR) profile as...

10.1117/12.2086056 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2015-03-19

Wet chemical processes in integrated circuit (IC) manufacturing are used many applications, e.g., post-etch residue removal and pre-deposition surface treatment. While advanced single-wafer wet spin tools part of the critical tool-set for IC fabrication, non-optimized tool hardware and/or process may induce different types wafer charging issues. In this paper, a physical model to fundamentally explain induced by is described. The based on advection charges from wafer-center wafer-edge...

10.1109/tsm.2011.2162346 article EN IEEE Transactions on Semiconductor Manufacturing 2011-07-21

In recent technology nodes, advanced process and novel integration scheme have challenged the precision limits of conventional metrology; with critical dimensions (CD) device reduce to sub-nanometer region. Optical metrology has proved its capability precisely detect intricate details on complex structures, however, RCWA-based (rigorous coupled wave analysis) scatterometry limitations long time-to-results lack flexibility adapt wide variations. Signal Response Metrology (SRM) is a new...

10.1117/12.2219775 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2016-03-10

Metallic spherules of variable character have been recovered from Antarctic snow. Three types were recognized their surface features: type I, smooth, polished spherules, apparently produced by melting the particles upon entry into earth's atmosphere; II, with a corrugated caused differential hardness internal, intersecting lamellae, but modified superimposed pits; and III, random, circular depressions or pits resulting impact submicroscopic particles. Spherules II III too small to suffered...

10.1126/science.142.3592.581 article EN Science 1963-11-01

Groundwater is the primary source of drinking water in areas with decentralized supplies. Lately this resource being increasingly contaminated due to both natural and anthropogenic activities. A literature review groundwater quality impact activities has been conducted. This covers a broad spectrum organic inorganic pollutants that impacted across world. The includes extensive coverage peer reviewed journal articles, reports, books periodicals published 2012. Particular emphasis placed on...

10.2175/106143013x13698672322787 article EN Water Environment Research 2013-10-01

Controlling thickness and composition of gate stack layers in logic memory devices is critical to ensure transistor performance meets requirements, especially at 10nm node due the 3-d geometry tight process budget. It has become necessary measure control each layer before after dielectric metal deposition sequences. A typical can have 5-7 including interfacial layer, high-k dielectric, stack, work function layers, cap layers. Similarly, PMOS channel strain controlled using a graded...

10.1117/12.2220462 article EN Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE 2016-03-18
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