The increasing number of embedded instruments used to perform test, monitoring, calibration and debug within a semiconductor device has called for brand new standard-the IEEE 1687. Such standard resorts reconfigurable scan network provide efficient flexible access handle complex structures. As it deliver reliable service, many approaches, both formal simulation-based, have been proposed in the literature diagnosis verification such networks. This paper focuses on problem post-silicon...

Nowadays, industries require reliable methods for accessing the instrumentations embedded within semiconductor devices. The situation led to definition of standards, such as IEEE 1687, designing required infrastructures, and proposal techniques test them. So far, most test-generation approaches are either too computationally demanding be applied in complex cases, or approximate yield high-quality tests. This paper exploits a recent idea: state generic reconfigurable scan chain is modeled...

With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large number embedded instruments became a necessity. The IEEE 1687 standard was introduced provide flexibility in accessing and controlling such instrumentation through reconfigurable scan chain. Nowadays, together with testing system for defects that may affect chains themselves, diagnosis faults is also important. This article proposes method generating stimuli precisely identify permanent...

The broad need to efficiently access all the instrumentation embedded within a semiconductor device called for standardization, and reconfigurable scan networks proposed in IEEE 1687 have been demonstrated effective handling complex infrastructures. At same time, different techniques test new circuitry required; however, most of automatic approaches are either too computationally demanding be applied cases, or approximate yield high-quality tests. This paper models state network with finite...

In last years, the Internet of Things (IoT) has gained attention in relevant fields application as Industry 4.0. IoT is usually structured around three layers according to computing capacity and energy cost: cloud, fog, edge. This paper focuses on edge layer which close end-user. Specifically, authors fully address a binary image classification problem without going toward upper layers, i.e., intelligence computation brought layer, instead being simple sensing devices. To this end, propose...

Nowadays, many Integrated Systems embed auxiliary on-chip instruments whose function is to perform test, debug, calibration, configuration, etc. The growing complexity and the increasing number of these have led new solutions for their access control, such as IEEE 1687 standard. standard introduces an infrastructure composed scan chains incorporating configurable elements accessing in a flexible manner. Such known Reconfigurable Scan Network or RSN. Since permanent faults affecting circuitry...

A fundamental part of the new IEEE Std 1687 is Instrument Connectivity Language (ICL), which allows for abstract description scan network. The big novelty if compared to legacy solutions like BSDL possibility describing topology-enabling elements such as Scan-Muxes in a behavioural way can be easily and efficiently exploited by Test Generation Tools retarget instrument-level operations top-level patterns. This means that given design, Developer will have write both RTL ICL descriptions:...

Recent trends in integrated circuits industry include decentralization of the production flow by involving different integration teams, third-party IP vendors and other untrusted entities. As a result, this is opening up door to new types attacks that may lead devastating consequences, such as denial service or data leakage. Therefore, problem ensuring hardware security has gained much attention last years, especially early design cycle, when an attacker insert malicious circuitry at...

The Negative Bias Temperature Instability (NBTI) phenomenon is one of the main reliability issues in today's nanoelectronic systems. It causes increase threshold voltage pMOS transistors, thus degrading signal propagation delay logic paths between flip-flops. Recently, IEEE published a new standard 1687 for Reconfigurable Scan Networks (RSN) to facilitate access embedded instrumentation within an integrated circuit. In field, RSN infrastructure often exploited fault-management...