A5102922888- Force Microscopy Techniques and Applications
- Iterative Learning Control Systems
- Mechanical and Optical Resonators
- Micro and Nano Robotics
- Near-Field Optical Microscopy
- Advanced Sensor and Energy Harvesting Materials
- Advanced Materials and Mechanics
- Piezoelectric Actuators and Control
South China University of Technology
2023
To deal with the challenges that classical Bouc–Wen model fails to precisely characterize amplitude-dependent hysteresis and asymmetric hysteresis, an improved variable parameters is presented. The proposed introduces terms parameter functions related sinusoidal excitation amplitudes into model. It has a relatively simple mathematic form can be easily identified applied for inverse feedforward compensation in real-time applications. By comparison other existing models, superiority of been...
This article presents a novel harmonic atomic force microscopy with tip-sample couplings (TS-HAFM) working in modulation mode for imaging samples of different mechanical properties. Compared traditional (T-HAFM), TS-HAFM has better characteristics and resolution. T-HAFM does not consider the effect on probe vibration; it can only generate harmonics free vibration state. However, after tip touches sample, coupling shifts frequency attenuates probe's characteristics. considers prevent problems...