S. Kadlec

ORCID: 0009-0007-5236-9925
Publications
Citations
Views
---
Saved
---
About
Contact & Profiles
Research Areas
  • Metal and Thin Film Mechanics
  • Copper Interconnects and Reliability
  • Diamond and Carbon-based Materials Research
  • GaN-based semiconductor devices and materials
  • Plasma Diagnostics and Applications
  • Semiconductor materials and devices
  • Ion-surface interactions and analysis
  • nanoparticles nucleation surface interactions
  • Metallurgical and Alloy Processes
  • High-Temperature Coating Behaviors
  • Advanced materials and composites
  • Coagulation and Flocculation Studies
  • Vacuum and Plasma Arcs
  • Silicon and Solar Cell Technologies
  • Acoustic Wave Resonator Technologies
  • Particle Dynamics in Fluid Flows
  • Fusion materials and technologies
  • Advanced Materials Characterization Techniques
  • High voltage insulation and dielectric phenomena
  • Dust and Plasma Wave Phenomena
  • Spectroscopy and Quantum Chemical Studies
  • Tribology and Wear Analysis
  • Advancements in Semiconductor Devices and Circuit Design
  • Gas Dynamics and Kinetic Theory
  • Plasma Applications and Diagnostics

Eaton (Taiwan)
2023

Tescan (Czechia)
2023

HVM Plasma (Czechia)
2010-2019

Czech Academy of Sciences, Institute of Physics
1991-2001

Czech Academy of Sciences
1994-2001

Transnational University Limburg
1997

Hasselt University
1996

Institute of Physics of the Slovak Academy of Sciences
1988-1991

Cross-sectional transmission electron microscopy (XTEM) has been used to investigate the effects of variations in low-energy ion irradiation flux during growth reactively sputter-deposited TiN. The films were deposited on steel substrates with a negative bias 100 V at 350 °C mixed Ar–N2 discharges pressure 5 Pa (37 mTorr). ion-to-Ti arrival rate ratio Jion /JTi substrate was varied between 0.3 and 7.1 through use variable external magnetic field. Films grown ≲2 had columnar morphology highly...

10.1116/1.577428 article EN Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1991-05-01

10.1016/0257-8972(90)90079-r article EN Surface and Coatings Technology 1990-12-01

The hysteresis effect occurring in reactive sputtering is shown by pumping speed analysis to arise from loss gettering throughput, consequent on reduction target yield, without rise throughput. Change this balance due higher can result stable conditions.

10.1088/0022-3727/19/9/004 article EN Journal of Physics D Applied Physics 1986-09-14

The behavior of neutral component the plasma during high power impulse magnetron sputtering was studied. Movement particles including sputtered metal (Ti) and Ar gas an (200 µs, 1 kA, kV) has been simulated using direct simulation Monte Carlo method. When discharge current reaches kA range, very strong rarefaction in main region occurs volume density exceeds several times. This may contribute to ratio ions observed experiments. Rapid movement form a shock wave toward substrate results...

10.1002/ppap.200731101 article EN Plasma Processes and Polymers 2007-04-01

This paper presents a critical review of the present status and trends in sputtering thin films. A special attention is devoted to magnetron sputtering, especially unbalanced magnetrons (UM) new devices utilizing magnetic and/or electric plasma confinement. The last category opens possibilities production high quality Sputtering systems using UM operated double-site-sustained discharge closed multipolar field are described. also effects ion bombardment on properties deposited In case hard...

10.1116/1.577597 article EN Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1991-05-01

The reactive sputtering of hard coatings as TiN in large distances and/or on substrates is difficult to perform with the conventional magnetron. A strong magnetic confinement plasma between magnetron target and enhances gas ionization raises ion current Is extracted substrates. new system a multipolar (MMPC) described. It consists planar unbalanced (UM), diameter 120 mm equipped two coils, coupled closed field formed by set permanent magnets located internal surfaces deposition chamber....

10.1116/1.576874 article EN Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1990-05-01

Views Icon Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Twitter Facebook Reddit LinkedIn Tools Reprints and Permissions Cite Search Site Citation L. R. Shaginyan, M. Mišina, S. Kadlec, Jastrabı́k, A. Macková, V. Peřina; Mechanism of the film composition formation during magnetron sputtering WTi. Journal Vacuum Science Technology A 1 September 2001; 19 (5): 2554–2566. https://doi.org/10.1116/1.1392401 Download citation file: Ris (Zotero) Reference Manager...

10.1116/1.1392401 article EN Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2001-09-01

10.1016/0257-8972(89)90064-9 article EN Surface and Coatings Technology 1989-12-01

Titanium and aluminum targets have been reactively sputtered in Ar +O2 or +N2 gas mixtures order to systematically investigate the effect of reduced hysteresis reactive high power impulse magnetron sputtering (HiPIMS) as compared other techniques utilizing low discharge target density (e.g., direct current pulsed mid-frequency sputtering) operated at same average power. We found that negative slope flow rate gettered by material a function partial pressure is clearly lower case HiPIMS. This...

10.1063/1.4977816 article EN Journal of Applied Physics 2017-03-08

A tendency to disappearing hysteresis in reactive High Power Impulse Magnetron Sputtering (HiPIMS) has been reported previously without full physical explanation. An analytical model of pulsed sputtering including HiPIMS is presented. The combines a Berg-type with the global Christie-Vlček. Both time and area averaging used describe macroscopic steady state, especially gas balance reactor. most important effect presented covering reacted parts target by returning ionized metal, effectively...

10.1063/1.4977815 article EN Journal of Applied Physics 2017-03-08

Presented is a generalized microphysical model for reactive sputtering, taking into account inhomogeneities of both the target erosion and deposition films on condensing surfaces substrates chamber walls. The integral quantities, as total metal ejection rate or gas consumption, can be treated if were homogeneous but over properly determined effective areas. Conversely, local coverage by compound film composition, are strongly influenced inhomogeneities. Both wall area Aw substrate As...

10.1116/1.576765 article EN Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1990-05-01
Coming Soon ...