Enhancement of Piezoelectric Response in Scandium Aluminum Nitride Alloy Thin Films Prepared by Dual Reactive Cosputtering
Scandium
DOI:
10.1002/adma.200802611
Publication Date:
2008-12-02T15:52:28Z
AUTHORS (6)
ABSTRACT
A high-temperature piezoelectric material exhibits a good balance between high maximum use temperature and large piezoelectricity. This is achieved by the combination of discovery phase transition in scandium aluminum nitride (ScxAl1 − xN) alloy thin films, dual cosputtering, which leads to nonequilibrium films.
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