Element Specific Monolayer Depth Profiling

• DOI: 10.1002/adma.201402028
• Publication Date: 2014-08-08T05:41:51Z
• Authors: Sebastian Macke; Abdullah Radi; Jorge E. Hamann‐B...; Adriano Verna; Martin Bluschke; Sebastian Brück; Eberhard Goering; Ronny Sutarto; Feizhou He; Georg Cristiani; Meng Wu; Eva Benckiser; Hanns‐Ulrich Habe...; Gennady Logvenov; Nicolas Gauquelin; Gianluigi A. Botton; Adam P. Kajdos; Susanne Stemmer; George A. Sawatzky; Maurits W. Haverkort; Bernhard Keimer; Vladimir Hinkov
• Keywords: Optical Phenomena; Spectrum Analysis; X-Rays; 0103 physical sciences; 01 natural sciences; Nanostructures

The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.