Probing Bilayer Grain Boundaries in Large‐Area Graphene with Tip‐Enhanced Raman Spectroscopy

Misorientation Bilayer graphene
DOI: 10.1002/adma.201603601 Publication Date: 2016-12-09T14:19:25Z
ABSTRACT
The bilayer grain boundaries (GBs) in chemical-vapor-deposition-grown large-area graphene are identified using multispectral tip-enhanced Raman imaging with 18 nm spatial resolution. misorientation angle of the GBs is determined from a quantitative analysis phonon-scattering properties associated modified electronic structure.
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