Probing Bilayer Grain Boundaries in Large‐Area Graphene with Tip‐Enhanced Raman Spectroscopy
Misorientation
Bilayer graphene
DOI:
10.1002/adma.201603601
Publication Date:
2016-12-09T14:19:25Z
AUTHORS (5)
ABSTRACT
The bilayer grain boundaries (GBs) in chemical-vapor-deposition-grown large-area graphene are identified using multispectral tip-enhanced Raman imaging with 18 nm spatial resolution. misorientation angle of the GBs is determined from a quantitative analysis phonon-scattering properties associated modified electronic structure.
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