Universal Route to Impart Orthogonality to Polymer Semiconductors for Sub‐Micrometer Tandem Electronics
Semiconducting films
Photolithography
orthogonal polymer semiconductor gel
sub-micrometer tandem electronics
Conventional photolithography
Solution process
Submicrometers
Polymer films
sequential solution processes
Polymer semiconductors
semi-interpenetrating diphasic polymer network
02 engineering and technology
Micrometers
Organic light emitting diodes (OLED)
Logic devices
Etching
Polymer light emitting diode
High-resolution patterns
Polymer networks
Complementary inverters
0210 nano-technology
DOI:
10.1002/adma.201901400
Publication Date:
2019-05-07T19:15:26Z
AUTHORS (18)
ABSTRACT
AbstractA universal method that enables utilization of conventional photolithography for processing a variety of polymer semiconductors is developed. The method relies on imparting chemical and physical orthogonality to a polymer film via formation of a semi‐interpenetrating diphasic polymer network with a bridged polysilsesquioxane structure, which is termed an orthogonal polymer semiconductor gel. The synthesized gel films remain tolerant to various chemical and physical etching processes involved in photolithography, thereby facilitating fabrication of high‐resolution patterns of polymer semiconductors. This method is utilized for fabricating tandem electronics, including pn‐complementary inverter logic devices and pixelated polymer light‐emitting diodes, which require deposition of multiple polymer semiconductors through solution processes. This novel and universal method is expected to significantly influence the development of advanced polymer electronics requiring sub‐micrometer tandem structures.
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