Universal Route to Impart Orthogonality to Polymer Semiconductors for Sub‐Micrometer Tandem Electronics

Semiconducting films Photolithography orthogonal polymer semiconductor gel sub-micrometer tandem electronics Conventional photolithography Solution process Submicrometers Polymer films sequential solution processes Polymer semiconductors semi-interpenetrating diphasic polymer network 02 engineering and technology Micrometers Organic light emitting diodes (OLED) Logic devices Etching Polymer light emitting diode High-resolution patterns Polymer networks Complementary inverters 0210 nano-technology
DOI: 10.1002/adma.201901400 Publication Date: 2019-05-07T19:15:26Z
ABSTRACT
AbstractA universal method that enables utilization of conventional photolithography for processing a variety of polymer semiconductors is developed. The method relies on imparting chemical and physical orthogonality to a polymer film via formation of a semi‐interpenetrating diphasic polymer network with a bridged polysilsesquioxane structure, which is termed an orthogonal polymer semiconductor gel. The synthesized gel films remain tolerant to various chemical and physical etching processes involved in photolithography, thereby facilitating fabrication of high‐resolution patterns of polymer semiconductors. This method is utilized for fabricating tandem electronics, including pn‐complementary inverter logic devices and pixelated polymer light‐emitting diodes, which require deposition of multiple polymer semiconductors through solution processes. This novel and universal method is expected to significantly influence the development of advanced polymer electronics requiring sub‐micrometer tandem structures.
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