Hydrogen‐Bonding Integrated Low‐Dimensional Flexible Electronics Beyond the Limitations of van der Waals Contacts

Contact resistance
DOI: 10.1002/adma.202404626 Publication Date: 2024-06-03T04:53:30Z
ABSTRACT
Abstract Van der Waals (vdW) integration enables clean contacts for low‐dimensional electronic devices. The limitation remains; however, that an additional tunneling contact resistance occurs owing to the inherent vdW gap between metal and semiconductor. Here, it is demonstrated from theoretical calculations stronger non‐covalent hydrogen‐bonding interactions facilitate electron significantly reduce resistance; thus, promising break limitations of contact. π‐plane in surface‐engineered MXene/carbon nanotube metal/semiconductor heterojunctions are realized, anomalous temperature‐dependent observed. Low‐dimensional flexible thin‐film transistors integrated by exhibit both excellent flexibility carrier mobility orders magnitude higher than their counterparts with contacts. This strategy demonstrates a scalable solution realizing high‐performance low‐power electronics beyond
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