Control of Interface Defects for Efficient and Stable Quasi‐2D Perovskite Light‐Emitting Diodes Using Nickel Oxide Hole Injection Layer

• DOI: 10.1002/advs.201801350
• Publication Date: 2018-10-06T03:41:49Z
• Authors: Seungjin Lee; Da Bin Kim; Iain Hamilton; Matyas Daboczi; Yun Seok Nam; Bo Ram Lee; Baodan Zhao; Chung Hyeon Jang; Richard H. Friend; Ji‐Seon Kim; Myoung Hoon Song
• Keywords: 621; nickel oxide; 535; perovskite light‐emitting diodes; stability; 530; 7. Clean energy; 01 natural sciences; Communications; defects; 0104 chemical sciences

AbstractMetal halide perovskites (MHPs) have emerged as promising materials for light‐emitting diodes owing to their narrow emission spectrum and wide range of color tunability. However, the low exciton binding energy in MHPs leads to a competition between the trap‐mediated nonradiative recombination and the bimolecular radiative recombination. Here, efficient and stable green emissive perovskite light‐emitting diodes (PeLEDs) with an external quantum efficiency of 14.6% are demonstrated through compositional, dimensional, and interfacial modulations of MHPs. The interfacial energetics and optoelectronic properties of the perovskite layer grown on a nickel oxide (NiOx) and poly(3,4‐ethylenedioxythiophene):polystyrene sulfonate hole injection interfaces are investigated. The better interface formed between the NiOx/perovskite layers in terms of lower density of traps/defects, as well as more balanced charge carriers in the perovskite layer leading to high recombination yield of carriers are the main reasons for significantly improved device efficiency, photostability of perovskite, and operational stability of PeLEDs.