The Origin of High‐Voltage Stability in Single‐Crystal Layered Ni‐Rich Cathode Materials
High Voltage
DOI:
10.1002/ange.202207225
Publication Date:
2022-08-10T05:31:57Z
AUTHORS (7)
ABSTRACT
Abstract Compared with the polycrystal (PC) Ni‐rich cathode materials, single‐crystal (SC) counterpart displayed excellent structural stability, high reversible capacity and limited voltage decay during cycling, which received great attention from academics industry. However, origin of fascinating high‐voltage stability within SC is poorly understood yet. Herein, we tracked evolution phase transitions, in destructive volume change H3 formation presented PC, are effectively suppressed when cycling at a cut‐off 4.6 V, further clarifying cathode. Moreover, electrode crack‐free morphology, electrochemical long‐term whereas PC suffered severe fade because spinel‐like phase, decoding failure mechanisms voltages. This finding provides universal insights into layered materials.
SUPPLEMENTAL MATERIAL
Coming soon ....
REFERENCES (55)
CITATIONS (13)
EXTERNAL LINKS
PlumX Metrics
RECOMMENDATIONS
FAIR ASSESSMENT
Coming soon ....
JUPYTER LAB
Coming soon ....