Evaluating structural, morphological, and multifractal aspects of n‐ZnO/p‐ZnO homojunctions and n‐ZnO/p‐NiO heterojunctions

• DOI: 10.1002/jemt.24319
• Publication Date: 2023-03-28T14:10:08Z
• Authors: Atefeh Ghaderi; Azizollah Shafiek...; Ştefan Ţălu; Laya Dejam; Shahram Solaymani; Ilya A. Morozov; Robert S. Matos; Nilson S. Ferreira; Amir H. Sari
• Keywords: Non-blocking I/O

We have investigated the evolution of structure and surface morphology n-ZnO/p-ZnO homojunctions n-ZnO/p-NiO heterojunctions transparent structures deposited by radio frequency-sputtering on quartz (Q)/ITO substrates. X-ray diffraction (XRD) analysis as-deposited annealed ZnO, n-ZnO/p-NiO/Q/ITO, n-ZnO/p-ZnO/Q/ITO thin films showed that ZnO had a wurtzite hexagonal (002) preferred growth direction. The annealing temperature played key role in improving crystalline films, as evidenced changes intensity position XRD peak. Morphological revealed roughness film varies with increasing temperature. Particle size dictates vertical p-ZnO homojunctions, while particle shape dictated p-NiO growth. Fractal similar spatial complexity, percolation, topographical uniformity are dominated low dominant frequencies. Moreover, robust multifractal character was observed, where follow dynamics, which differed from dynamics. These results prove plays structure, morphology,