Recent Progress in Electro‐Optic Modulators: Physical Phenomenon, Structures Properties, and Integration Strategy

• DOI: 10.1002/lpor.202400624
• Publication Date: 2024-10-16T11:09:41Z
• Authors: Yixin Yan; Haoran Zhang; Xiaolei Liu; Liuxing Peng; Qian Zhang; Guangbin Yu; Qing Wu; Haitao Li
• Keywords: Phenomenon

Abstract Electro‐optic modulators (EOMs), serving as indispensable components within photonic integrated circuits, are essential for enabling energy‐efficient, high‐speed, and high‐capacity optical communication systems. This review illustrates the principal physical phenomenon exploited in EOMs provides a comprehensive analysis of cutting‐edge featuring interference structures (Mach–Zehnder Michelson‐interferometer modulators) resonance (microring modulators, racetrack crystal modulators). The comparative performance merits limitations is presented, highlighting combination diverse electro‐optic material compositions with different structures, which reveals promising integration strategic so to pursue trade‐off modulation performance. It contributed ongoing discourse on optimizing subsequent technologies advancement chips.