Determination of the Complex Refractive Index of GaSb1−xBixby Variable‐Angle Spectroscopic Ellipsometry

• DOI: 10.1002/pssa.202400017
• Publication Date: 2024-07-24T01:49:32Z
• Authors: John McElearney; Kevin Grossklaus; T. Pan Menasuta; Thomas Vandervelde
• Keywords: 02 engineering and technology; 0210 nano-technology

Variable‐angle spectroscopic ellipsometry is used to determine the room temperature complex refractive index of molecular beam epitaxy grown GaSb1−xBixfilms withx ≤ 4.25% over a spectral range of 0.47–6.2 eV. By correlating to critical points in the extinction coefficientk, the energies of several interband transitions are extracted as functions of Bi content. The observed change in the fundamental bandgap energy (E0, −36.5 meV per %Bi) agrees well with previously published values; however, the samples examined here show a much more rapid increase in the spin‐orbit splitting energy (Δ0, +30.1 meV per Bi) than previous calculations have predicted. As in the related GaAsBi, the energy of transitions involving the top of the valence band are observed to have a much stronger dependence on Bi content than those that do not, suggesting the valence band maximum is most sensitive to Bi alloying. Finally, the effects of surface droplets on both the complex refractive index and the critical point energies are examined.