The electronic band structure analysis of OLED device by means of in situ LEIPS and UPS combined with GCIB

• DOI: 10.1002/sia.6777
• Publication Date: 2020-03-23T14:25:28Z
• Authors: Masahiro Terashima; Takuya Miyayama; Tetsuro Shirao; Hin Wai Mo; Yasuhiro Hatae; Hiroshi Fujimoto; Katsumi Watanabe
• Keywords: Indium tin oxide; Ultraviolet photoelectron spectroscopy

Low‐energy inverse photoelectron spectroscopy (LEIPS) and ultraviolet (UPS) incorporated into the multitechnique XPS system were used to probe ionization potential electron affinity of organic materials, respectively. By utilizing gas cluster ion beam (GCIB), in situ analyses depth profiling LEIPS UPS also demonstrated. The band structures 10‐nm‐thick buckminsterfullerene (C 60 ) thin film on Au (100 nm)/indium tin oxide nm)/glass substrate successfully evaluated direction.