An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1

• DOI: 10.1007/bf00134942
• Publication Date: 2004-11-02T14:43:10Z
• Authors: C. M. Maunder; R. E. Tulloss

ANSI/IEEE Std 1149.1 defines a standard implementation of boundary scan that, it is hoped, will be built into many catalog and application-specific integrated circuits. The standard was developed as a solution to two continuing trends that are having a significant, adverse, impact on the task of testing loaded printed wiring boards: increasing chip complexity and greater miniaturization. The former increases the difficulty of test generation, while the latter impedes access for the bed-of-nails and hand-held probes on which many established test techniques depend.