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Sources of measurement error of fast-flowing process parameters by charge-coupled devices

02 engineering and technology 0210 nano-technology
DOI: 10.1007/bf00833220 Publication Date: 2004-12-15T11:23:37Z
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AUTHORS (5)
V. A. Arutyunov
V. G. Mel'nikov
S. M. Slobodyan
D. P. Chaporov
O. N. Popov
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