Influence of tip geometry on fractal analysis of atomic force microscopy images

• DOI: 10.1007/s003390051262
• Publication Date: 2002-08-25T09:25:39Z
• Authors: A. Mannelquist; N. Almqvist; S. Fredriksson
• Keywords: 02 engineering and technology; 0210 nano-technology

Fractal analysis of data from atomic force microscopy (AFM) is often necessary for studying surfaces with scale-invariant roughness. However, the fractal parameters are influenced by the finite-siz ...