A Method for the Localization of an Elongated Subsurface Defect in a Conducting Material

Structural material Component (thermodynamics)
DOI: 10.1007/s11003-005-0096-8 Publication Date: 2005-06-16T08:38:44Z
ABSTRACT
We propose a method for the localization of a long subsurface defect in a conducting material by using the magnetic field measured on the surface of the analyzed object. It is shown that, to find the point of localization of the defect, it suffices to know the value of one component of the magnetic field at the points of measurements. The numerical testing of the proposed method is performed.
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