Application of Bayesian model averaging using a fixed effects model with linear drift for the analysis of key comparison CCM.P-K12

• DOI: 10.1007/s11018-013-0249-3
• Publication Date: 2013-10-11T16:50:46Z
• Authors: O. Bodnar; A. Link; K. Klauenberg; K. Jousten; C. Elster
• Keywords: 0202 electrical engineering, electronic engineering, information engineering; 02 engineering and technology

In this paper, we extend a recently proposed procedure for the analysis of key comparison data to the case where the traveling standard shows a linear drift. The procedure is based on a fixed effects model and assumes that a certain number of the laboratories measure without bias. The analysis is carried out by applying Bayesian model averaging to all possible different models, each assuming zero biases for a different subset of laboratories. The method is applied to the key comparison CCM.P-K12.