Quantitatively Analyzing Strength Contribution vs Grain Boundary Scale Relation in Pure Titanium Subjected to Severe Plastic Deformation

• DOI: 10.1007/s11661-016-3391-0
• Publication Date: 2016-02-22T16:11:57Z
• Authors: Peng Luo; Qiaodan Hu; Xiaolin Wu
• Keywords: 0103 physical sciences; 01 natural sciences

Electron backscatter diffraction was used to reveal high- and low-angle grain boundaries (HAGBs, with misorientation ≥15 deg, and LAGBs, <15 deg) in pure titanium (ASTM grade 2) subjected to equal channel angular pressing. Comprehensive paradigms were developed to present relations of yield strength vs HAGB grain diameter, and LAGB contribution vs LAGB linear intercept. Incorporating grain orientations (against loading axis) into the Hall–Petch relation, we quantitatively investigated the strength contributions by HAGBs and LAGBs, respectively.