Precise Calculation of the Optical Constants of Self-standing Nanoporous Silicon Layers

Molar absorptivity Nanoporous Porous Silicon
DOI: 10.1007/s12633-023-02358-x Publication Date: 2023-02-25T04:25:31Z
ABSTRACT
Abstract The precise knowledge of the values of the optical constants (index of refraction, n, and extinction coefficient, k) for nanostructured porous silicon (nanoPS) is a necessary condition to predict the behavior of any optical and photonic devices based on this material. With this objective in mind, a simulation computational program based on the matrix method was used to determine the values of the optical constants in the visible range of self-standing nanoPS films from their experimental reflectance and transmittance spectra. Furthermore, the spectral absorption coefficient (α) was determined from the spectral k values, which motivated to the determination of the values and type of bandgap (direct or indirect) for different porosities
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