Prototype of single-event effect localization system with CMOS pixel sensor

• DOI: 10.1007/s41365-022-01128-5
• Publication Date: 2022-11-08T19:04:33Z
• Authors: Jun Liu; Zhuo Zhou; Dong Wang; Shi-Qiang Zhou; Xiang-Ming Sun; Wei-Ping Ren; Bi-Hui You; Chao-Song Gao; Le Xiao; Ping Yang; Di Guo; Guang-Ming Huang; Wei Zhou; Cheng-Xin Zhao; Min Wang
• Keywords: Radiation hardening; radiation damage