Deposition of MAX phase-containing thin films from a (Ti,Zr)2AlC compound target
Technology
Materials Science
FOS: Physical sciences
02 engineering and technology
Physics, Applied
Inorganic Chemistry
Materials Science, Coatings & Films
M(N+1)AX(N) PHASES
(TiZr)(2)AlC
COATINGS
Oorganisk kemi
Condensed Matter - Materials Science
Science & Technology
MAX phase solid solution
Chemistry, Physical
Physics
Materials Science (cond-mat.mtrl-sci)
MECHANICAL-PROPERTIES
Chemistry
Physics, Condensed Matter
Physical Sciences
CR2ALC
Compound target
THERMAL-EXPANSION
MICROSTRUCTURE
0210 nano-technology
Magnetron sputtering
Magnetron sputtering; Compound target; MAX phase solid solution; (TiZr)(2)AlC
DOI:
10.1016/j.apsusc.2021.149370
Publication Date:
2021-02-25T03:06:53Z
AUTHORS (10)
ABSTRACT
This work reports on sputter depositions carried out from a compound (Ti,Zr)2AlC target, whereupon Al-containing (Ti,Zr)C thin films (30-40 nm in thickness) were deposited on MgO(111) and Al2O3(0001) substrates at temperatures ranging between 500 and 900 °C. The presence of Al within the carbide structure was evidenced by lattice parameter variations. Furthermore, chemical analyses showed that the Al distribution throughout the film thickness was fairly homogeneous. Thicker films (80-90 nm) deposited from the same compound target consisted of the pseudo-binary (Ti,Zr)C and intermetallic compounds in the Ti-Zr-Al system up to 800 °C, as well as solid solution MAX phases with different Ti:Zr ratios at 900 °C. X-ray diffraction and transmission electron microscopy showed that both (Ti,Zr)2AlC and (Ti,Zr)3AlC2 solid solution MAX phases were formed. Moreover, this work discusses the growth mechanism of the thicker films, which started with the formation of the mixed (Ti,Zr)C carbide, followed by the nucleation and growth of aluminides, eventually leading to the formation of the MAX phases, which was the primary objective of the sputter depositions.
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CITATIONS (19)
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