Fault data generation of lithium ion batteries based on digital twin: A case for internal short circuit

• DOI: 10.1016/j.est.2023.107113
• Publication Date: 2023-03-28T08:06:30Z
• Authors: Zhuchen Yuan; Yue Pan; Huaibin Wang; Shuyu Wang; Yong Peng; Changyong Jin; Chengshan Xu; Xuning Feng; Kai Shen; Yuejiu Zheng; Zhendong Zhang; Minggao Ouyang
• Keywords: Thermal Runaway; Catastrophic failure; Internal resistance