Multilayered surface plasma resonance waveguide sensing device

• DOI: 10.1016/j.ijleo.2017.01.049
• Publication Date: 2017-01-25T20:24:50Z
• Authors: Jun Zhu; Wenju Xu; Zhengjie Xu; Fu Deli; Duqu Wei
• Keywords: 02 engineering and technology; 0210 nano-technology

Abstract In recent years, surface plasma resonance (SPR) technology for the preparation of multifunctional detection chips has drawn considerable research attention. This study designs a multilayered SPR waveguide sensing device based on a metal medium that features moderate temperature and humidity. The surface plasma is stimulated using a Kretschmann-type structure and a single temperature and humidity chip of SPR technology to achieve multifunctional detection. The sensing principle of the proposed device is based on SPR angle and the environmental relationship between relative humidity and temperature. Characteristic analysis also verifies that SPR with an incident wavelength of 632 nm can be accomplished by the basic linear relationship between the resonance angle and SiO 2 refractive inde. The accuracy of dual-channel sensors is higher than that of single-channel sensors. The metal layer for gold channel sensitivity can reach 7000 nm/RIU. The dual-channel sensor designed in this study exhibits low refractive index, temperature, and humidity and can thus achieve improved sensitivity.